The G50 x-ray inspection system incorporates dual linear array technology which is unrivalled for its sensitivity, speed, and sophistication of detection to inspect large, rigid containers. This dual detector technology enables detection of very thin materials such as a thin glass shard within a thick glass container.

The G50 is the sibling system to the G30 and G35, the main difference being the capability to inspect larger containers. In addition to contaminant detection, the G50 can improve product quality through inspection of fill volumes and mass to ensure they are correct. It can also detect damaged items.

We offer the option to customise your x-ray system to suit your needs. If the transfer of an item from one conveyor to another is problematic, the G50 can be provided as an ‘up and over’ system that fits onto your existing conveyor. Alternatively, it can be provided with an integrated conveyor.